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URLhttps://doi.org/10.18429/JACoW-ICALEPCS2025-THPD045
TitleIntegration of microchannel plate delay line detector within the Karabo control system at the SXP instrument of the European XFEL
Authors
  • I. Karpics, D. Doblas-Jimenez, M. Izquierdo, A. Muennich, P. Grychtol, M. Heber, E. Tikhodeeva, V. Vardanyan, M. Turcato, S. Hauf
    European X-Ray Free-Electron Laser
AbstractThe Soft X-Ray Port (SXP) instrument at European X-Ray Free Electron Laser (EuXFEL) facility is designed to provide a flexible environment for time and spin-resolved X-ray photoelectron spectroscopy (TR-XPES) experiments. Two key components of the TR-XPES experimental station are the time-of-flight (ToF) momentum microscope spectrometer and the microchannel plate delay line detector (MCP-DLD detector). This contribution describes the key steps and challenges of integration of the MCP-DLD detector at the SXP instrument and in to the Karabo control system.
Paperdownload: THPD045.pdf
CiteBibTeX, LaTeX, Text/Word, RIS, EndNote
Conference20th Int. Conf. Accel. Large Exp. Phys. Control Syst. (ICALEPCS'25)
Series
LocationChicago, IL, USA
Date20-26 Sep 2025
PublisherJACoW Publishing, Geneva, Switzerland
Editorial BoardKent Wootton (ANL), Jeffery Biss (FNAL), Gustavo Bruno (ANL), Jeff Kirchman (ANL), Kelly Jaje (ANL), Denise Skiadopoulos (ANL), SuYin Grass Wang (ANL)
Online ISBN978-3-95450-255-4
Online ISSN2226-0358
Received03 September 2025
Revised18 September 2025
Accepted20 October 2025
Issued25 November 2025
DOI10.18429/JACoW-ICALEPCS2025-THPD045
Pages1689-1693