Journals of Accelerator Conferences Website (JACoW)
JACoW
is a publisher in Geneva, Switzerland that publishes the
proceedings of accelator conferences held around the world
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| URL | https://doi.org/10.18429/JACoW-IBIC2024-WEP52 |
|---|---|
| Title | Data Acquisition And Processing Platform Design For SHINE Wire Scanner |
| Authors |
|
| Abstract | The Shanghai High repetition rate XFEL and Extreme light facility (SHINE) accelerates electrons to 8GeV with a high repetition rate of up to 1MHz. For the transverse beam profile measurement in the high energy sections wire scanner is used as an essential part of the accelerator diagnostic system, providing the tool to measure small beam size in an almost non-destructive manner. The prototype of the data acquisition and processing platform of wire scanner is designed and installed at the Shanghai soft X-ray Free Electron Laser (SXFEL) for verification. The experimental results show that the platform can be used for the SHINE. |
| Paper | download: WEP52.pdf |
| Cite | BibTeX, LaTeX, Text/Word, RIS, EndNote |
| Conference | Proc. 13th International Beam Instrumentation Conference |
| Series | |
| Location | Beijing |
| Date | 09-13 Sep 2024 |
| Publisher | JACoW Publishing, Geneva, Switzerland |
| Editorial Board | Jianshe Cao (IHEP), Junhui Yue (IHEP), Lin Bian (IHEP), Ivan Andrian (Elettra-Sincrotrone Trieste S.C.p.A.), Volker RW Schaa (GSI), Zhichu Chen (SARI) |
| Online ISBN | 978-3-95450-249-3 |
| Online ISSN | 2673-5350 |
| Received | 31 August 2024 |
| Revised | 06 September 2024 |
| Accepted | 06 September 2024 |
| Issued | 11 December 2024 |
| DOI | 10.18429/JACoW-IBIC2024-WEP52 |
| Pages | 392-395 |
| Copyright | Published by JACoW Publishing under the terms of the Creative Commons Attribution 4.0 license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |