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URLhttps://doi.org/10.18429/JACoW-IBIC2024-WEP18
TitleTroubleshooting the Ionization Profile Monitor (IPM) for CSNS 1.6 GeV RCS
Authors
  • M. Rehman, R. Yang, W. Huang, X. Li, X. Nie, Z. Xu
    Institute of High Energy Physics
  • J. Sun
    Paul Scherrer Institute
  • P. Forck
    GSI Helmholtzzentrum für Schwerionenforschung GmbH
  • S. Wang
    Institute of High Energy Physics, CAS
AbstractNon-invasive and turn-by-turn beam transverse profile monitoring is essential for the tunning and operating CSNS 1.6 GeV Rapid Cyclic Synchrotron. A residual gas Ionization Profile Monitor (IPM) was designed and installed in RCS for horizontal beam profile measurement. However, several challenges related to electromagnetic interference (EMI), vacuum, and MCP operation in the IPM were identified. The EMI is induced by the beam itself and further accelerator components. An improved Faraday cage was implemented to counteract the EMI issues. In order to achieve the desired MCP gain, a suitable pull-down resistor was incorporated into the MCP power supply circuit. After these improvements, the IPM was commissioned successfully. This paper will describe the challenges of IPM and early beam commissioning results.
Paperdownload: WEP18.pdf
CiteBibTeX, LaTeX, Text/Word, RIS, EndNote
ConferenceProc. 13th International Beam Instrumentation Conference
Series
LocationBeijing
Date09-13 Sep 2024
PublisherJACoW Publishing, Geneva, Switzerland
Editorial BoardJianshe Cao (IHEP), Junhui Yue (IHEP), Lin Bian (IHEP), Ivan Andrian (Elettra-Sincrotrone Trieste S.C.p.A.), Volker RW Schaa (GSI), Zhichu Chen (SARI)
Online ISBN978-3-95450-249-3
Online ISSN2673-5350
Received05 September 2024
Revised09 September 2024
Accepted10 September 2024
Issued11 December 2024
DOI10.18429/JACoW-IBIC2024-WEP18
Pages301-304