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URLhttps://doi.org/10.18429/JACoW-IBIC2024-WEP10
TitleOptimized design of an consecutive double-slit emittancemeter for the c-band photocathode rf gun
Authors
  • W. Chen, R. Liu, R. Yang, S. Jiang, X. Li
    Institute of High Energy Physics
  • S. Wang
    Institute of High Energy Physics, CAS
  • T. Yang
    Institute of Plasma Physics
  • X. Li
    Deutsches Elektronen-Synchrotron DESY at Zeuthen
AbstractTo enhance the performance of the next generation of X-ray free electron lasers (XFEL), it is essential to produce a high quality electron beam with a low emittance, for instance, below 0.2 mm-mrad for a 100 pC bunch charge. In order to demonstrate the fundamental techniques required for future FEL facilities, a C-band photoinjector test facility has been constructed aligning with the Southern Advanced Photon Source (SAPS) pre-research project. An emittancemeter based on the consecutive double-slit-scan concept has been proposed and designed for determining such small emittance. This paper presents the further optimization of the primary parameters of this emittancemeter employing numerical simulations in the presence of the measured motion accuracy and the expected observation resolution.
Paperdownload: WEP10.pdf
CiteBibTeX, LaTeX, Text/Word, RIS, EndNote
ConferenceProc. 13th International Beam Instrumentation Conference
Series
LocationBeijing
Date09-13 Sep 2024
PublisherJACoW Publishing, Geneva, Switzerland
Editorial BoardJianshe Cao (IHEP), Junhui Yue (IHEP), Lin Bian (IHEP), Ivan Andrian (Elettra-Sincrotrone Trieste S.C.p.A.), Volker RW Schaa (GSI), Zhichu Chen (SARI)
Online ISBN978-3-95450-249-3
Online ISSN2673-5350
Received05 September 2024
Revised09 September 2024
Accepted11 September 2024
Issued11 December 2024
DOI10.18429/JACoW-IBIC2024-WEP10
Pages266-270