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URLhttps://doi.org/10.18429/JACoW-IBIC2024-WEP02
TitleBunch-by-bunch profile measurement during beam available time
Authors
  • R. Wu, B. Sun, J. Wang, L. Tang, P. Lu, X. Ma
    University of Science and Technology of China
AbstractThis paper presents a bunch-by-bunch profile measurement system, which includes an optical imaging frontend, a multi-channel photomultiplier tube (MAPMT) for photoelectric conversion, and a high-sampling-rate oscilloscope for data recording. The system is capable of measuring the transverse positions and sizes of each bunch in the storage ring during the beam availability period of the Hefei Light Source II (HLS-II). By finely processing the collected data, the system can effectively recognize the dynamic characteristics of the beams and monitor the performance of the light source. Here, the paper elaborates on the system’s design principles, optical layout and system configuration. It also introduces the program workflow of data processing, along with an analysis of the corresponding measurement errors.
Paperdownload: WEP02.pdf
CiteBibTeX, LaTeX, Text/Word, RIS, EndNote
ConferenceProc. 13th International Beam Instrumentation Conference
Series
LocationBeijing
Date09-13 Sep 2024
PublisherJACoW Publishing, Geneva, Switzerland
Editorial BoardJianshe Cao (IHEP), Junhui Yue (IHEP), Lin Bian (IHEP), Ivan Andrian (Elettra-Sincrotrone Trieste S.C.p.A.), Volker RW Schaa (GSI), Zhichu Chen (SARI)
Online ISBN978-3-95450-249-3
Online ISSN2673-5350
Received31 August 2024
Revised08 September 2024
Accepted08 September 2024
Issued11 December 2024
DOI10.18429/JACoW-IBIC2024-WEP02
Pages245-249