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URLhttps://doi.org/10.18429/JACoW-IBIC2024-THP42
TitleA test bench for 324 MHz RF deflectors used in bunch shape monitors for CSNS-II linac upgrade
Authors
  • Q. Liu
    University of Chinese Academy of Sciences
  • W. Huang, F. Li, J. Wei, L. Zeng, M. Rehman, R. Yang, R. Qiu, X. Nie, X. Liu, Z. Xu
    Institute of High Energy Physics
  • B. Tan
    Institute of High Energy Physics, CAS
  • J. Liang
    Dongguan Neutron Science Center
  • M. Liu
    Chinese Academy of Sciences
AbstractBunch shape monitors based on the transverse modulation of low energy secondary emission elec-trons, will be used in the measurement of longitudinal beam density distribution in the upgrade of CSNS-II linac. A test bench for commissioning the 324MHz RF deflectors used in BSM has been built in the laborato-ry, which consists of a Kimball E-gun, a vacuum chamber for electron optics, an RF stimulator, a 324MHz RF power source, HV power supplies, a bending magnet and a set of MCP+Screen+camera+DAQ. This paper gives the design consideration, some results of the test bench and the continuing CST design of a λ/2 RF deflector.
Paperdownload: THP42.pdf
CiteBibTeX, LaTeX, Text/Word, RIS, EndNote
ConferenceProc. 13th International Beam Instrumentation Conference
Series
LocationBeijing
Date09-13 Sep 2024
PublisherJACoW Publishing, Geneva, Switzerland
Editorial BoardJianshe Cao (IHEP), Junhui Yue (IHEP), Lin Bian (IHEP), Ivan Andrian (Elettra-Sincrotrone Trieste S.C.p.A.), Volker RW Schaa (GSI), Zhichu Chen (SARI)
Online ISBN978-3-95450-249-3
Online ISSN2673-5350
Received06 September 2024
Revised12 September 2024
Accepted12 September 2024
Issued11 December 2024
DOI10.18429/JACoW-IBIC2024-THP42
Pages576-578