| Title |
A Study of the Gain of Microchannel Plates in the Ionization Profile Monitors at Fermilab |
| Authors |
- R.M. Thurman-Keup, C.E. Lundberg, D. Slimmer, J.R. Zagel
Fermilab, Batavia, Illinois, USA
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| Abstract |
One of the on-going issues with the use of microchannel plates (MCP) in the ionization profile monitors (IPM) at Fermilab is the significant decrease in gain over time. There are several possible issues that can cause this. Historically, the assumption has been that this is aging, where the secondary emission yield (SEY) of the pore surface changes after some amount of extracted charge. Recent literature searches have brought to light the possibility that this is an initial ’scrubbing’ effect whereby adsorbed gasses are removed from the MCP pores by the removal of charge from the MCP. This paper discusses the results of studies conducted on the IPMs in the Main Injector at Fermilab.
|
| Funding |
This work was produced by Fermi Research Alliance, LLC under Contract No. DE-AC02-07CH11359 with the U.S. Department of Energy. |
| Paper |
download WEP025.PDF [1.178 MB / 5 pages] |
| Poster |
download WEP025_POSTER.PDF [7.408 MB] |
| Cite |
download ※ BibTeX
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※ EndNote |
| Conference |
IBIC2023 |
| Series |
International Beam Instrumentation Conference (12th) |
| Location |
Saskatoon, Canada |
| Date |
10-14 September 2023 |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editorial Board |
Volker R.W. Schaa (GSI, Darmstadt, Germany); Tonia Batten (CLS, Saskatoon, Canada); Michael Bree (CLS, Saskatoon, Canada); Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Darren Hunter (CLS, Saskatoon, Canada) |
| Online ISBN |
978-3-95450-236-3 |
| Online ISSN |
2673-5350 |
| Received |
08 September 2023 |
| Revised |
10 September 2023 |
| Accepted |
11 September 2023 |
| Issue Date |
18 September 2023 |
| DOI |
doi:10.18429/JACoW-IBIC2023-WEP025 |
| Pages |
405-409 |
| Copyright |
 Published by JACoW Publishing under the terms of the Creative Commons Attribution 4.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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