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https://doi.org/10.18429/JACoW-IBIC2023-WEP020
Title Performance Evaluation of GAGG+ and Tungsten Carbide Blades in an X-ray Pinhole Camera
Authors
  • S.B. Burholt, L. Bobbpresenter, N. Vitoratou
    DLS, Harwell, United Kingdom
Abstract At Diamond Light Source two X-ray pinhole cameras are used to measure the transverse profile of the 3 GeV electron beam. The current pinhole assembly is formed using tungsten blades with chemically etched shims to produce a 25 µm x 25 µm aperture and the imager incorporates a 0.2 mm LuAG:Ce scintillator. Tungsten carbide is a machinable high-Z material which at millimetre thicknesses is opaque to X-rays. With a slight change in pinhole design, similar to that already in place at the ESRF, tungsten carbide blades could offer a well-controlled aperture size for the pinhole camera with simpler assembly. Further to this, improvements to the photon yield of scintillators mean that the new scintillator GAGG+ has an almost two fold increase in yield compared to the current LuAG: Ce scintillator. An evaluation of the tungsten carbide blades and GAGG+ scintillator is presented.
Paper download WEP020.PDF [0.628 MB / 5 pages]
Poster download WEP020_POSTER.PDF [0.468 MB]
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Conference IBIC2023
Series International Beam Instrumentation Conference (12th)
Location Saskatoon, Canada
Date 10-14 September 2023
Publisher JACoW Publishing, Geneva, Switzerland
Editorial Board Volker R.W. Schaa (GSI, Darmstadt, Germany); Tonia Batten (CLS, Saskatoon, Canada); Michael Bree (CLS, Saskatoon, Canada); Christine Petit-Jean-Genaz (CERN, Geneva, Switzerland); Darren Hunter (CLS, Saskatoon, Canada)
Online ISBN 978-3-95450-236-3
Online ISSN 2673-5350
Received 07 September 2023
Revised 08 September 2023
Accepted 13 September 2023
Issue Date 24 September 2023
DOI doi:10.18429/JACoW-IBIC2023-WEP020
Pages 382-386
Copyright
Creative Commons CC logoPublished by JACoW Publishing under the terms of the Creative Commons Attribution 4.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI.