Samadi, N. Lovric, G. Ozkan Loch, C. Shi, X. JACoW Publishing Geneva, Switzerland 2673-5350 978-3-95450-241-7 10.18429/JACoW-IBIC2022-WE1C2 English 366-369 synchrotron simulation experiment emittance undulator Contribution to a conference proceedings 2022 2022-12 https://doi.org/10.18429/JACoW-IBIC2022-WE1C2 https://jacow.org/ibic2022/papers/we1c2.pdf The advance in low-emittance x-ray sources urges the development of novel diagnostic techniques. Existing systems either have limited resolution or rely heavily on the quality of the optical system. An x-ray beam property analyzer based on a multi-crystal diffraction geometry was recently introduced. By measuring the transmitted beam profile of a dispersive Laue crystal downstream of a double-crystal monochromator, the system can provide a high-sensitivity characterization of spatial source properties, namely, size, divergence, position, and angle in the diffraction plane of the system at a single location in a beamline. In this work, we present the experimental validation at a super-bending magnet beamline at the Swiss Light Source and refine the method to allow for time-resolved characterization of the beam. Simulations are then carried out to show that the system is feasible to characterize source properties at undulator beamlines for fourth-generation light sources.