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<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Richard, C.J.</author>
             <author>Aboulbanine, Z.</author>
             <author>Adhikari, G.D.</author>
             <author>Aftab, N.</author>
             <author>Boonpornprasert, P.</author>
             <author>Georgiev, G.Z.</author>
             <author>Groß, M.</author>
             <author>Hoffmann, A.</author>
             <author>Krasilnikov, M.</author>
             <author>Li, X.-K.</author>
             <author>Lueangaramwong, A.</author>
             <author>Niemczyk, R.</author>
             <author>Qian, H.J.</author>
             <author>Stephan, F.</author>
             <author>Vashchenko, G.</author>
             <author>Weilbach, T.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Correction for Systematic Errors in Transverse Phase Space Measurements at PITZ
          </title>
       </titles>
       <publisher>JACoW Publishing</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>2673-5350</isbn>
		 <isbn>978-3-95450-241-7</isbn>
		 <electronic-resource-num>10.18429/JACoW-IBIC2022-TUP20</electronic-resource-num>
		 <language>English</language>
		 <pages>273-276</pages>
       <keywords>
          <keyword>emittance</keyword>
          <keyword>electron</keyword>
          <keyword>FEL</keyword>
          <keyword>solenoid</keyword>
          <keyword>gun</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2022</year>
          <pub-dates>
             <date>2022-12</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>https://doi.org/10.18429/JACoW-IBIC2022-TUP20</url>
              <url>https://jacow.org/ibic2022/papers/tup20.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          The Photo Injector Test Facility at DESY in Zeuthen (PITZ) characterizes and optimizes electron sources for use at FLASH and European XFEL. AT PITZ, the transverse phase space is measured using a single slit scan and scintillator screen method. With the trend in photoinjectors towards lower current and emittance, these measurements become increasingly influenced by systematic errors including camera resolution and scintillator response due to smaller spot sizes. This study investigates the effects and corrections of the systematic errors for phase space measurements at PITZ.
       </abstract>
    </record>
  </records>
</xml>
