<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Pinayev, I.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Measurement of the Second Moments of Transverse Beam Distribution with Solenoid Scan
          </title>
       </titles>
		 <publisher>JACoW Publishing</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>2673-5350</isbn>
		 <isbn>978-3-95450-204-2</isbn>
		 <electronic-resource-num>10.18429/JACoW-IBIC2019-WEPP042</electronic-resource-num>
		 <language>English</language>
		 <pages>642-644</pages>
       <pages>WEPP042</pages>
       <keywords>
          <keyword>electron</keyword>
          <keyword>emittance</keyword>
          <keyword>solenoid</keyword>
          <keyword>experiment</keyword>
          <keyword>controls</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2019</year>
          <pub-dates>
             <date>2019-11</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>https://doi.org/10.18429/JACoW-IBIC2019-WEPP042</url>
              <url>http://jacow.org/ibic2019/papers/wepp042.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          Measurement of the dependence of the beam size on profile monitor vs. strength of a focusing element is widely used for measurement of the beam parameters. Such measurements are mostly used for the separate planes and assumption that beam satisfied Gaussian distribution. In many linear accelerators the transverse beam dynamics is coupled between planes and distribution is far from the Gaussian. We developed measurement technique of the second moments of beam distribution which does not rely on any assumptions. The theory and experimental results are presented.
       </abstract>
    </record>
  </records>
</xml>
