Bobb, L. Rehm, G. JACoW Publishing Geneva, Switzerland 978-3-95450-201-1 10.18429/JACoW-IBIC2018-WEPB18 English 477-481 WEPB18 target photon electron emittance storage-ring Contribution to a conference proceedings 2019 2019-01 https://doi.org/10.18429/JACoW-IBIC2018-WEPB18 http://jacow.org/ibic2018/papers/wepb18.pdf X-ray pinhole cameras are used to measure the transverse beam profile of the electron beam in the storage ring from which the emittance is calculated. As improvements to the accelerator lattice reduce the beam emittance, e.g. with upgrades to fourth generation synchrotron light sources, likewise the beam size will be reduced such that micron and sub-micron scale resolution is required for beam size measurement. Therefore the spatial resolution of the pinhole camera imaging system must be improved accordingly. Here, the performance of a reflective microscope objective is compared to the high quality refractive lens which is currently in use to image the scintillator screen to the camera. The modulation transfer functions for each system have been assessed and will be discussed.