<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Kim, G.</author>
             <author>Kang, H.-S.</author>
             <author>Kim, C.</author>
             <author>Oh, B.G.</author>
             <author>Shin, D.C.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Wire Scanner Measurements at the PAL-XFEL
          </title>
       </titles>
		 <publisher>JACoW Publishing</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>978-3-95450-201-1</isbn>
		 <electronic-resource-num>10.18429/JACoW-IBIC2018-WEPB09</electronic-resource-num>
		 <language>English</language>
		 <pages>445-447</pages>
       <pages>WEPB09</pages>
       <keywords>
          <keyword>undulator</keyword>
          <keyword>FEL</keyword>
          <keyword>electron</keyword>
          <keyword>emittance</keyword>
          <keyword>controls</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2019</year>
          <pub-dates>
             <date>2019-01</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>https://doi.org/10.18429/JACoW-IBIC2018-WEPB09</url>
              <url>http://jacow.org/ibic2018/papers/wepb09.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          The PAL-XFEL, an X-ray Free electron laser user facility based on a 10 GeV normal conducting linear accelerator, have been operational at Pohang, South Korea. The wire scanners are installed for transverse beam profile measurement of the Linac and the Hard X-ray undulator section. The wire scanner is a useful device for emittance measurements in the Hard X-ray undulator section. In this paper, we describe the details of the wire scanner and the results of the measurements.
       </abstract>
    </record>
  </records>
</xml>
