Identification of Faulty Beam Position Monitor Based Clustering by Fast Search and Find of Density Peaks

Jiang, Ruitao; Chen, Fangzhou; Chen, Zhichu; Leng, Yongbin

doi:10.18429/JACoW-IBIC2018-MOPC02

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BiBTeX citation export for MOPC02: Identification of Faulty Beam Position Monitor Based Clustering by Fast Search and Find of Density Peaks

@InProceedings{Jiang:IBIC2018-MOPC02,
  author       = {R. Jiang and F.Z. Chen and Z.C. Chen and Y.B. Leng},
  title        = {{I}dentification of {F}aulty {B}eam {P}osition {M}onitor {B}ased {C}lustering by {F}ast {S}earch and {F}ind of {D}ensity {P}eaks},
  booktitle    = {Proc. 7th International Beam Instrumentation Conference (IBIC'18),
                  Shanghai, China, 09-13 September 2018},
  pages        = {114--117},
  paper        = {MOPC02},
  language     = {english},
  keywords     = {SRF, storage-ring, electron, electronics, operation},
  venue        = {Shanghai, China},
  series       = {International Beam Instrumentation Conference},
  number       = {7},
  publisher    = {JACoW Publishing},
  address      = {Geneva, Switzerland},
  month        = {Jan.},
  year         = {2019},
  isbn         = {978-3-95450-201-1},
  doi          = {doi:10.18429/JACoW-IBIC2018-MOPC02},
  url          = {http://jacow.org/ibic2018/papers/mopc02.pdf},
  note         = {https://doi.org/10.18429/JACoW-IBIC2018-MOPC02},
}