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https://doi.org/10.18429/JACoW-IBIC2018-WEOC02
Title Review of Recent Status of Coded Aperture X-ray Monitors for Beam Size Measurement
Authors
  • J.W. Flanagan
    KEK, Ibaraki, Japan
Abstract X-ray beam profile monitors based on coded aperture imaging use an array of pinholes or slits to achieve large open apertures, which provide improved photon collection efficiency over single pinholes or slits. The resulting improvement in photon statistics makes possible single-bunch, single-turn measurements at lower bunch currents than are possible with a single pinhole or slit. In addition, the coded aperture pattern provides extra information for beam profile reconstruction, which makes possible somewhat improved resolution, as compared to a single slit. The reconstruction algorithm for coded aperture imaging is more complicated and computing-intensive than that for a single slit, though with certain classes of coded pertures a faster reconstruction method is possible. This talk will provide a survey of efforts to use coded aperture imaging for beam profile diagnostics at accelerators to date, covering principles and practical experiences with the technique, as well as prospects for the future at SuperKEKB, where it forms the primary means of measuring vertical beam sizes.
Funding US-Japan Cooperation in High Energy Physics (Japan Monbukagakusho and US DOE). Kakenhi.
Paper download WEOC02.PDF [0.262 MB / 5 pages]
Slides download WEOC02_TALK.PDF [4.065 MB]
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Conference IBIC2018
Series International Beam Instrumentation Conference (7th)
Location Shanghai, China
Date 09-13 September 2018
Publisher JACoW Publishing, Geneva, Switzerland
Editorial Board Volker RW Schaa (GSI, Darmstadt, Germany)
Online ISBN 978-3-95450-201-1
Received 12 September 2018
Accepted 24 September 2018
Issue Date 29 January 2019
DOI doi:10.18429/JACoW-IBIC2018-WEOC02
Copyright
Creative Commons CC logoPublished by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI.