| Title |
RF Deflector Based Measurements of the Correlations Between Vertical and Longitudinal Planes at ELI-NP-GBS Electron LINAC |
| Authors |
- L. Sabato
U. Sannio, Benevento, Italy
- P. Arpaia, A. Liccardo
Naples University Federico II, Science and Technology Pole, Napoli, Italy
- A. Cianchi
Università di Roma II Tor Vergata, Roma, Italy
- A. Giribono, A. Mostaccipresenter, L. Palumbo
Sapienza University of Rome, Rome, Italy
- C. Vaccarezza, A. Variola
INFN/LNF, Frascati (Roma), Italy
|
| Abstract |
The correlations between vertical and longitudinal planes at the Radio Frequency Deflector (RFD) entrance can be introduced by misalignments of accelerating sections or quadrupoles upstream of the RFD. These correlations are undesired effects and they can affect the RFD based bunch length measurements in high-brightness electron LINAC. In this paper, an RFD based measurement technique for vertical and longitudinal planes is proposed. The basic idea is to obtain information about the correlations between vertical and longitudinal planes from vertical spot size measurements varying the RFD phase, because they add contributions on this quantity. In particular, considering a small RFD phase range centred in 0 or π rad, the correlations between the particle longitudinal positions and the vertical plane are constant with the deflecting voltage phase, on the contrary, the correlations between the particle energies and the vertical plane vary linearly with the deflecting voltage phase. The simulations are carried out by means of ELEctron Generation ANd Tracking (ELEGANT) code in the case of the Gamma Beam System (GBS) at the Extreme Light Infrastructure-Nuclear Physics (ELI-NP).
|
| Paper |
download WEPCC20.PDF [0.197 MB / 4 pages] |
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| Conference |
IBIC2017, Grand Rapids, MI, USA |
| Series |
International Beam Instrumentation Conference (6th) |
| Proceedings |
Link to full IBIC2017 Proccedings |
| Session |
Wednesday Poster |
| Date |
23-Aug-17 16:00–18:00 |
| Main Classification |
6 Beam Profile Monitors |
| Keywords |
ion, electron, linac, laser, brightness |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Zhengzheng Liu (FRIB, East Lansing, MI, USA); Steven Lidia (FRIB, East Lansing, MI, USA); Amy McCausey (FRIB, East Lansing, MI, USA); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-192-2 |
| Published |
March 2018 |
| Copyright |
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