| Title |
Simulation Supported Profile Reconstruction With Machine Learning |
| Authors |
- R. Singh, M. Sapinski, D.M. Vilsmeierpresenter
GSI, Darmstadt, Germany
|
| Abstract |
Measured IPM profiles can be significantly distorted due to displacement of residual ions or electrons by interaction with beam fields for high intensity or high energy beams. It is thus difficult to deduce the characteristics of the actual beam profile from the measurements. Neural network with multilayer perceptron (MLP)architecture is applied to reconstruct the actual beam profile from the measurement data. The MLP is trained using the IPM simulation tool developed under the IPMSim collaboration. The first results are presented in this contribution.
|
| Paper |
download WEPCC06.PDF [0.779 MB / 5 pages] |
| Export |
download ※ BibTeX
※ LaTeX
※ Text/Word
※ RIS
※ EndNote |
| Conference |
IBIC2017, Grand Rapids, MI, USA |
| Series |
International Beam Instrumentation Conference (6th) |
| Proceedings |
Link to full IBIC2017 Proccedings |
| Session |
Wednesday Poster |
| Date |
23-Aug-17 16:00–18:00 |
| Main Classification |
6 Beam Profile Monitors |
| Keywords |
ion, simulation, space-charge, network, electron |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Zhengzheng Liu (FRIB, East Lansing, MI, USA); Steven Lidia (FRIB, East Lansing, MI, USA); Amy McCausey (FRIB, East Lansing, MI, USA); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-192-2 |
| Published |
March 2018 |
| Copyright |
|
