<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Zhukov, A.P.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             SNS RFQ Voltage Measurements Using X-Ray Spectrometer
          </title>
       </titles>
		 <publisher>JACoW</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>978-3-95450-177-9</isbn>
		 <electronic-resource-num>10.18429/JACoW-IBIC2016-MOPG44</electronic-resource-num>
		 <language>English</language>
		 <pages>154-156</pages>
       <pages>MOPG44</pages>
       <keywords>
          <keyword>rfq</keyword>
          <keyword>shielding</keyword>
          <keyword>radiation</keyword>
          <keyword>background</keyword>
          <keyword>electron</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2017</year>
          <pub-dates>
             <date>2017-02</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>http://dx.doi.org/10.18429/JACoW-IBIC2016-MOPG44</url>
              <url>http://jacow.org/ibic2016/papers/mopg44.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          Absolute measurement of vane voltage is essential to understand RFQ transmission. We used a non-intrusive technique of bremsstrahlung X-ray measurement. Several windows were installed at SNS to allow measurement of the X-ray spectrum in different locations of the RFQ. A CdTe spectrometer was used to estimate spectrum cutoff energy that corresponds to the vane voltage. Different device setups are described as well as measurement accuracy and interpretation of experimental data.
       </abstract>
    </record>
  </records>
</xml>
