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DOI:10.18429/JACoW-IBIC2016-TUBL04
Title Electro-Optical Methods for Multipurpose Diagnostics
Authors
  • R. Pompili, M.P. Anania, M. Bellaveglia, F.G. Bisesto, E. Chiadroni, A. Curcio, D. Di Giovenale, G. Di Pirro, M. Ferrario
    INFN/LNF, Frascati (Roma), Italy
  • A. Cianchi
    INFN-Roma II, Roma, Italy
  • A. Zigler
    The Hebrew University of Jerusalem, The Racah Institute of Physics, Jerusalem, Israel
Abstract Electro-optic sampling (EOS) based temporal diagnostics allows to precisely measure the temporal profile of electron bunches with resolution of about 50 fs in a non-destructive and single-shot way. At SPARC_LAB we adopted the EOS in very different experimental fields. We measured for the first time the longitudinal profile of a train of multiple bunches at THz repetition rate, as the one required for resonant Plasma Wakefield Acceleration (PWFA) in a single-shot and non-intercepting way. By means of the EOS we demonstrated a new hybrid compression scheme that is able to provide ultra-short bunches (<90 fs) with ultra-low (<20 fs) timing-jitter relative to the EOS laser system. Furthermore, we recently developed an EOS system in order to provide temporal and energy measurements in a very noisy and harsh environment: electron beams ejected by the interaction of high-intensity (hundreds TW class) ultra-short (35fs) laser pulses with solid targets by means of the so-called Target Normal Sheath Acceleration (TNSA) method.
Paper download TUBL04.PDF [0.348 MB / 4 pages]
Slides download TUBL04_TALK.PDF [2.183 MB]
Conference IBIC2016, Barcelona, Spain
Series International Beam Instrumentation Conference (5th)
Proceedings Link to full IBIC2016 Proccedings
Session Time Resolve Diagnostics and Synchronization
Date 13-Sep-16   11:00–13:00
Main Classification Time Resolved Diagnostics and Synchronization
Keywords laser, electron, plasma, acceleration, target
Publisher JACoW, Geneva, Switzerland
Editors Isidre Costa (ALBA-CELLS, Barcelona, Spain); Ubaldo Iriso (ALBA-CELLS, Barcelona, Spain); Francis Pérez (ALBA-CELLS, Barcelona, Spain); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-177-9
Published February 2017
Copyright
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