| Title |
Transverse Beam Profiling and Vertical Emittance Control with a Double-Slit Stellar Interferometer |
| Authors |
- W.J. Corbett, X. Huang, J. Wu
SLAC, Menlo Park, California, USA
- C.L. Li, W.J. Zhang
East China University of Science and Technology, Shanghai, People's Republic of China
- T.M. Mitsuhashi
KEK, Ibaraki, Japan
- Y.H. Xu
DongHua University, Songjiang, People's Republic of China
- W.J. Zhang
University of Saskatchewan, Saskatoon, Canada
|
| Abstract |
Double-slit interferometers are useful tools to measure the transverse the cross-section of relativistic charged particle beams emitting incoherent synchrotron radiation. By rotating the double-slit about the beam propagation axis, the transverse beam profile can be reconstructed including beam tilt at the source. The interferometer can also be used as a sensitive monitor for vertical emittance control. In this paper we outline a simple derivation of the Van Cittert-Zernike theorem, present results for a rotating double-slit measurement and demonstrate application of the interferometer to vertical emittance control using the Robust Conjugate Direction Search (RCDS) optimization algorithm.
|
| Paper |
download MOPG70.PDF [0.460 MB / 4 pages] |
| Poster |
download MOPG70_POSTER.PDF [1.362 MB] |
| Conference |
IBIC2016, Barcelona, Spain |
| Series |
International Beam Instrumentation Conference (5th) |
| Proceedings |
Link to full IBIC2016 Proccedings |
| Session |
Monday Poster Session |
| Date |
12-Sep-16 16:00–18:00 |
| Main Classification |
Transverse Profile Monitors |
| Keywords |
controls, electron, coupling, optics, radiation |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Isidre Costa (ALBA-CELLS, Barcelona, Spain); Ubaldo Iriso (ALBA-CELLS, Barcelona, Spain); Francis Pérez (ALBA-CELLS, Barcelona, Spain); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-177-9 |
| Published |
February 2017 |
| Copyright |
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