| Title |
SNS RFQ Voltage Measurements Using X-Ray Spectrometer |
| Authors |
- A.P. Zhukov
ORNL, Oak Ridge, Tennessee, USA
|
| Abstract |
Absolute measurement of vane voltage is essential to understand RFQ transmission. We used a non-intrusive technique of bremsstrahlung X-ray measurement. Several windows were installed at SNS to allow measurement of the X-ray spectrum in different locations of the RFQ. A CdTe spectrometer was used to estimate spectrum cutoff energy that corresponds to the vane voltage. Different device setups are described as well as measurement accuracy and interpretation of experimental data.
|
| Funding |
ORNL/SNS is managed by UT-Battelle, LLC, for the U.S. Department of Energy under contract DE-AC05-00OR22725. |
| Paper |
download MOPG44.PDF [1.376 MB / 3 pages] |
| Conference |
IBIC2016, Barcelona, Spain |
| Series |
International Beam Instrumentation Conference (5th) |
| Proceedings |
Link to full IBIC2016 Proccedings |
| Session |
Monday Poster Session |
| Date |
12-Sep-16 16:00–18:00 |
| Main Classification |
Machine Parameter Measurements |
| Keywords |
rfq, shielding, radiation, background, electron |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Isidre Costa (ALBA-CELLS, Barcelona, Spain); Ubaldo Iriso (ALBA-CELLS, Barcelona, Spain); Francis Pérez (ALBA-CELLS, Barcelona, Spain); Volker RW Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-177-9 |
| Published |
February 2017 |
| Copyright |
|
