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| URL | https://doi.org/10.18429/JACoW-HIAT2025-WEP05 |
|---|---|
| Title | Frequency dependence of BCS and residual resistance using multi-mode measurement of nitrogen-doped single-cell elliptical cavities |
| Authors |
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| Abstract | Various cavity surface treatments have been found to significantly improve cavity quality factor, Q0, with one such treatment being nitrogen-doping (N-doping). N-doped 1.3 GHz cavities were the first found to exhibit anti-Q slope, the increase of Q0 with accelerating field, Eacc. However, even with the use of the same N-doping recipes, this anti-Q slope behavior has not been realized in sub-GHz frequency cavities. In this study, we measured the Q0 and surface resistance, RS, of our N-doped, single-cell, elliptical cavity for both the 644 MHz fundamental mode (FM) and 1.45 GHz higher-order mode (HOM). As a result of multi-mode measurements, the BCS and residual resistances, the temperature-dependent and temperature-in-dependent RF surface resistances, could be determined without the influence of cavity-to-cavity surface treatment variations. We will discuss the frequency-dependent behaviors of the BCS and residual resistances. |
| Paper | download: WEP05.pdf |
| Cite | BibTeX, LaTeX, Text/Word, RIS, EndNote |
| Conference | 16th International Conference on Heavy Ion Accelerator Technology |
| Series | |
| Location | East Lansing, MI, USA |
| Date | 22-27 Jun 2025 |
| Publisher | JACoW Publishing, Geneva, Switzerland |
| Editorial Board | Ling Wang (FRIB/MSU), Kelly Jaje (ANL), Michelle Wier (FRIB/MSU), Kent Wootton (ANL), Tong Zhang (FRIB/MSU) |
| Online ISBN | 978-3-95450-260-8 |
| Online ISSN | 2673-5547 |
| Received | 23 June 2025 |
| Revised | 22 July 2025 |
| Accepted | 22 July 2025 |
| Issued | 13 October 2025 |
| DOI | 10.18429/JACoW-HIAT2025-WEP05 |
| Pages | 232-234 |
| Copyright | Published by JACoW Publishing under the terms of the Creative Commons Attribution 4.0 license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |