| Title |
Two Colors at the SASE3 Line of the European XFEL: Project Scope and First Measurements |
| Authors |
- S. Serkez, G. Geloni, N. Gerasimova, J. Grünert, S. Karabekyan, A. Koch, J. Laksman, Th. Maltezopoulos, T. Mazza, M. Meyer, S. Tomin
EuXFEL, Schenefeld, Germany
- W. Decking, L. Fröhlich, V. Kocharyan, Y.A. Kot, E. Saldin, E. Schneidmiller, M. Scholz, M.V. Yurkov, I. Zagorodnov
DESY, Hamburg, Germany
- M. Huttula
University of Oulu, Oulu, Finland
- E. Kukk
University of Turku, Turku, Finland
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| Abstract |
The European XFEL is a high-repetition rate facility that generates high-power SASE radiation pulses in three beamlines. A joint upgrade project, with Finnish universities, to equip the SASE3 beamline with a chicane has been recently approved to generate two SASE pulses with different photon energies and temporal separation. In this work we report the status of the project, its expected performance, and recent experimental results. Additionally, we discuss methods to diagnose the properties of the generated radiation.
|
| Paper |
download TUP062.PDF [0.528 MB / 4 pages] |
| Export |
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| Conference |
FEL2019 |
| Series |
Free Electron Laser Conference (39th) |
| Location |
Hamburg, Germany |
| Date |
26-30 August 2019 |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editorial Board |
Volker R.W. Schaa (GSI, Darmstadt, Germany); Winfried Decking (DESY, Hamburg, Germany); Harald Sinn (EuXFEL, Schenefeld, Germany); Gianluca Geloni (EuXFEL, Schenefeld, Germany); Siegfried Schreiber (DESY, Hamburg, Germany); Michaela Marx (DESY, Hamburg, Germany) |
| Online ISBN |
978-3-95450-210-3 |
| Online ISSN |
"" |
| Received |
20 August 2019 |
| Accepted |
29 August 2019 |
| Issue Date |
05 November 2019 |
| DOI |
doi:10.18429/JACoW-FEL2019-TUP062 |
| Pages |
195-198 |
| Copyright |
 Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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