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https://doi.org/10.18429/JACoW-FEL2017-TUP038
Title Experiments in Electron Beam Nanopatterning
Authors
  • C. Zhang, W.S. Graves, L.E. Malin, J. Spence
    Arizona State University, Tempe, USA
  • D.B. Cesar, J.M. Maxson, P. Musumeci, A. Urbanowicz
    UCLA, Los Angeles, USA
  • R.K. Li, E.A. Nanni, X. Shen, S.P. Weathersby, J. Yang
    SLAC, Menlo Park, California, USA
Abstract We report on experiments in nanopatterning electron beams from a photoinjector as a first step toward a compact XFEL (CXFEL). The nanopatterning is produced by Bragg diffraction of relativistic electron beams through a patterned Si crystal consisting of alternating thick and thin strips to produce nanometer-scale electron density modulations. Multi-slice simulations show that the target can be oriented for a two-beam condition where nearly 80% of the elastically scattered electron beam is diffracted into the 220 Bragg peak. An experiment at the two-beam condition measurement has been carried out at the SLAC UED facility showing this effect with 2.26 MeV electrons. We successfully proved a large portion of the main beam is diffracted into 220 spot by tuning the orientation of the sample. Future plans at UCLA are to observe the nanopatterned beam, and to investigate various grating periods, crystal thicknesses, and sample orientations to maximize the contrast in the pattern and explore tuning the period of the modulation. The SLAC measurement results will be presented along with design of the UCLA experiments.
Funding This work was supported by NSF Accelerator Science awards 1632780 and 1415583, NSF BioXFEL STC award 1231306, and DOE contracts DE-AC02-76SF00515 and DE-SC0009914.
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Conference FEL2017, Santa Fe, NM, USA
Series International Free Electron Laser Conference (38th)
Proceedings Link to full FEL2017 Proccedings
Session Poster II
Date 22-Aug-17   15:30–17:30
Main Classification Advanced Concepts & Techniques
Keywords ion, electron, experiment, FEL, simulation
Publisher JACoW, Geneva, Switzerland
Editors Kip Bishofberger (LANL, Los Alamos, NM, USA); Bruce Carlsten (LANL, Los Alamos, NM, USA); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-179-3
Published February 2018
Copyright
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