| Paper |
Title |
Page |
| TUPB26 |
Characterisation of the Systematic Effects of the Insertion Devices with Photon Beam Position Monitors
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126 |
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- E. D. van Garderen, M. Böge, J. T.M. Chrin, J. Krempasky, V. Schlott, T. Schmidt, A. Streun
PSI, Villigen
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The X-ray photon monitors at Swiss Light Source are used for beam-position stabilisation down to sub-micron level. The beam position changes are mainly induced by changing the insertion device (ID) settings. An ID correction scheme involves both digital beam-position monitors (DBPM) located inside the storage ring and analog photon monitors (XBPM) located inside beamline front-ends. However, a beam-position correction scheme optimised for the electron beam is not automatically optimal for the photon beam. A sub-micron stability of the photon beam by changing the ID-settings is possible only if the XBPM readouts are well characterised for each considered ID-setting. We account for some limitations of the XBPM readouts as well as for examples where a sub-micron stability for all considered ID-settings is achieved.
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| TUPB27 |
Recent Results from the Electron Beam Profile Monitor at the Swiss Light Source
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129 |
| |
- Å. Andersson
MAX-lab, Lund
- O. V. Chubar
SOLEIL, Gif-sur-Yvette
- A. Lüdeke, M. Rohrer, V. Schlott, A. Streun
PSI, Villigen
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Two different methods of beam profile measurements using a) visible-to-UV range synchrotron radiation and b) X-ray synchrotron radiation have been realized in a single diagnostics beam line at the Swiss Light Source (SLS). In the visible-to-UV case the vertically polarized synchrotron radiation renders an image heavily influenced by inherent emission and diffraction effects of synchrotron radiation. This nevertheless turns out to be an advantageous influence when determining rms beam profiles below 10 μm. However, high-precision wave-optics based calculations of the synchrotron light characteristics need to be performed (SRW-code) to ensure correct interpretation of the measured profiles. The visible-to-UV branch has a few built-in features allowing numerous cross-checks of the SRW-model. Surprisingly, wave-optics based calculations are also applicable, and required, for the X-ray pinhole camera setup. We briefly discuss the advantage of applying two different measuring techniques at the same source point. In total, for standard user operation at the SLS, the beam line has helped to establish a vertical emittance below 10 pmrad.
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| TUPC25 |
Design and Calibration of an Emittance Monitor for the PSI XFEL Project
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198 |
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- V. Schlott, Å. Andersson, M. Dach, S. C. Leemann, M. Rohrer, A. Streun
PSI, Villigen
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Paul Scherrer Institute (PSI) intends to realize a compact X-ray Free Electron Laser (XFEL) by developing a high brightness, high current electron source. Field emitter arrays (FEA) in combination with high gradient acceleration promise a substantial reduction of transverse emittances by up to one order of magnitude compared to existing electron sources for XFELs. A flexible, high resolution emittance monitor based on the "pepperpot measurement techique" has been designed for this "low emittance gun" project at PSI. The realization and the calibration procedure of the monitor will be described in this presentation.
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