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Forck, P.

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MOO3A02 Beam Induced Fluorescence (BIF) Monitor for Transverse Profile Determination of 5 to 750 MeV/u Heavy Ion Beams 33
 
  • F. Becker, C. A. Andre, P. Forck
    GSI, Darmstadt
  • D. Hoffmann
    TU Darmstadt, Darmstadt
  
  In the frame of the FAIR-project (facility for antiproton and ion research) at GSI, high intensity beams from protons to Uranium ions in the energy range from 100 MeV/u to 30 GeV/u are foreseen. In transport lines between the synchrotrons and in front of production targets a precise beam alignment is mandatory. Since the beam energy will increase from 90 Joule to about 104 Joule per ion pulse, conventional intercepting beam diagnostics may not be used. For transverse profile determination we investigated a non-intercepting Beam Induced Fluorescence (BIF) monitor in residual nitrogen. An image intensified CCD camera was used to record the fluorescence images representing the beam profile. The photon yield and background contribution were determined for different ion species, beam energies and N2 pressures. Applying narrowband 10 nm interference filters we mapped the spectral response and associated it with the N2 transitions. Profile distortions were compared to simulations taking into account effects as momentum transfer, gas dynamics and the electrical field of the ion beam. Additionally the feasibility and appropriate layout for different diagnostic tasks is discussed.  
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TUPB06 First Tests with the Sis18 Digital BPM System* 66
 
  • A. A. Galatis, P. Forck, K. Lang, A. Peters
    GSI, Darmstadt
  
  In this paper we describe new approaches for BPM (Beam Position Monitor) measurements, needed in hadron accelerators which have strongly varying beam parameters, such as intensity, accelerating frequency and bunch length. After the data collection and offline evaluation in 2005, first FPGA implementations of algorithms were completed in 2006 and tested at SIS18 and CERN PS. Main aspect of the first tests was the proof of concept in terms of online calculation feasibility. This includes online calculation of the needed integration windows as well as the baseline restoration algorithms. The realization of the hardware and the data handling are discussed. Least squares techniques were used for parametric fitting to gain bunch signal properties which can be used to monitor beam position.

*Founded by EU FP6-Design Studies

 
TUPB14 Test of a Silicon Photomultiplier for Ionization Profile Monitor Applications 90
 
  • D. A. Liakin, S. V. Barabin, A. Y. Orlov
    ITEP, Moscow
  • P. Forck, T. Giacomini
    GSI, Darmstadt
  
  A sample of SiPM (silicon photomultiplier) has been tested as an elementary light detector for accelerated beam fast profile evolution observation by using it in residual gas ionization profile monitors. A noise, sensitivity, dynamic range and timing parameters tests of SiPM were performed. A procedure of the data acquisition and following signal reconstruction is discussed. A special attention has been paid to the fine time resolution counting mode with single photon detection. A dedicated signal normalizing and time-to-digit converter design was prototyped and tested. In addition some different modes of operation and optical schemes are discussed in this paper. It is shown that fast optical detectors like SiPMs also could be used for high performance profile measurements with spatial resolution compatible with CCD sensors.