| Paper | Title | Page |
|---|---|---|
| TUPB26 | Characterisation of the Systematic Effects of the Insertion Devices with Photon Beam Position Monitors | 126 |
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| The X-ray photon monitors at Swiss Light Source are used for beam-position stabilisation down to sub-micron level. The beam position changes are mainly induced by changing the insertion device (ID) settings. An ID correction scheme involves both digital beam-position monitors (DBPM) located inside the storage ring and analog photon monitors (XBPM) located inside beamline front-ends. However, a beam-position correction scheme optimised for the electron beam is not automatically optimal for the photon beam. A sub-micron stability of the photon beam by changing the ID-settings is possible only if the XBPM readouts are well characterised for each considered ID-setting. We account for some limitations of the XBPM readouts as well as for examples where a sub-micron stability for all considered ID-settings is achieved. |