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| MOO3A02 |
Beam Induced Fluorescence (BIF) Monitor for Transverse Profile Determination of 5 to 750 MeV/u Heavy Ion Beams
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33 |
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- F. Becker, C. A. Andre, P. Forck
GSI, Darmstadt
- D. Hoffmann
TU Darmstadt, Darmstadt
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In the frame of the FAIR-project (facility for antiproton and ion research) at GSI, high intensity beams from protons to Uranium ions in the energy range from 100 MeV/u to 30 GeV/u are foreseen. In transport lines between the synchrotrons and in front of production targets a precise beam alignment is mandatory. Since the beam energy will increase from 90 Joule to about 104 Joule per ion pulse, conventional intercepting beam diagnostics may not be used. For transverse profile determination we investigated a non-intercepting Beam Induced Fluorescence (BIF) monitor in residual nitrogen. An image intensified CCD camera was used to record the fluorescence images representing the beam profile. The photon yield and background contribution were determined for different ion species, beam energies and N2 pressures. Applying narrowband 10 nm interference filters we mapped the spectral response and associated it with the N2 transitions. Profile distortions were compared to simulations taking into account effects as momentum transfer, gas dynamics and the electrical field of the ion beam. Additionally the feasibility and appropriate layout for different diagnostic tasks is discussed.
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Slides
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