| Title |
Cyclotrons Based Facilities for Single Event Effects Testing of Spacecraft Electronics |
| Authors |
- P.A. Chubunov, A.S. Bychkov
ISDE, Moscow, Russia
- V.S. Anashinpresenter, A.E. Koziukov
United Rocket and Space Corporation, Institute of Space Device Engineering, Moscow, Russia
- I.V. Kalagin, S.V. Mitrofanov
JINR, Dubna, Moscow Region, Russia
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| Abstract |
Space radiation is the main factor limiting the operation time of the onboard equipment of the spacecraft due to the radiation effects occurring in the electronic components. With a decrease in the size of semiconductor structures, the sensitivity to the effects of individual nuclear particles increases and hitting one such particle can cause an upset or even failure of a component or system as a whole. Since the phenomenon occurs due to the impact of a separate particle, these radiation effects are called Single Event Effects (SEE). To be sure that the electronic component is operational in space, ground tests are necessary. SEE tests are carried out on test facilities that allow accelerating heavy ions from C to Bi to energies from 3 to a few dozen MeV/A. Cyclotrons are best suited for this purpose. In this paper, the installations created by request of ISDE based on the cyclotrons of FLNR JINR are described.
|
| Paper |
download FRA04.PDF [2.610 MB / 5 pages] |
| Slides |
download FRA04_TALK.PDF [0.849 MB] |
| Export |
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※ EndNote |
| Conference |
Cyclotrons2019 |
| Series |
International Conference on Cyclotrons and their Applications (22nd) |
| Location |
Cape Town, South Africa |
| Date |
23-27 September 2019 |
| Publisher |
JACoW Publishing, Geneva, Switzerland |
| Editorial Board |
Lowry Conradie (iThemba LABS, Somerset West, South Africa); John Garrett De Villiers (iThemba LABS, Somerset West, South Africa); Volker RW Schaa (GSI, Darmstadt, Germany) |
| Online ISBN |
978-3-95450-205-9 |
| Received |
17 September 2019 |
| Accepted |
27 September 2019 |
| Issue Date |
20 June 2020 |
| DOI |
doi:10.18429/JACoW-Cyclotrons2019-FRA04 |
| Pages |
348-352 |
| Copyright |
 Published by JACoW Publishing under the terms of the Creative Commons Attribution 3.0 International license. Any further distribution of this work must maintain attribution to the author(s), the published article's title, publisher, and DOI. |
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