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DOI:10.18429/JACoW-Cyclotrons2016-MOB01
Title Cyclotron Technology and Beam Dynamics for Microbeam Applications
Authors
  • S. Kurashima, H. Kashiwagi, N. Miyawaki, S. Okumura, T. Satoh, K. Yoshida, T. Yuyama
    QST/Takasaki, Takasaki, Japan
  • M. Fukuda
    RCNP, Osaka, Japan
Abstract We have been improving a beam quality of the TIARA (Takasaki Ion accelerators for Advanced Radiation Application) cyclotron to form a heavy-ion microbeam with a spot size about 1 μm. The microbeam is used to irradiate such as living cells and semiconductor devices. In order to form the microbeam using focusing lenses, an energy spread on the order of 10⁻⁴ is required to eliminate chromatic aberration in the focusing lenses. A flat-top acceleration system using the fifth-harmonic frequency of the acceleration frequency was installed in the cyclotron to reduce the energy spread. In addition, a new center region, a magnetic field stabilization system and an acceleration phase control technique were developed to provide the microbeam stably for beam users. The energy spread of a 260 MeV Ne beam was reduced to 0.05% by the flat-top acceleration, and the microbeam with a spot size of approximately 1 um was successfully formed. However it takes about 8 h to tune the cyclotron and the focusing lenses. A cocktail beam acceleration technique was introduced to quickly change the microbeam to the other one within 0.5 h, and several microbeams can be used in a beam time as a result.
Paper download MOB01.PDF [1.024 MB / 5 pages]
Slides download MOB01_TALK.PDF [26.045 MB]
Conference Cyclotrons2016, Zurich, Switzerland
Series International Conference on Cyclotrons and Their Applications (21st)
Proceedings Link to full Cyclotrons2016 Proccedings
Session Beam Dynamics and Simulations
Date 12-Sep-16   10:30–11:40
Main Classification Cyclotron Applications
Keywords ion, cyclotron, acceleration, controls, vacuum
Publisher JACoW, Geneva, Switzerland
Editors Jan Chrin (PSI, Villigen, Switzerland); Jacobus M. Schippers (PSI, Villigen, Switzerland); Mike Seidel (PSI, Villigen, Switzerland); Volker RW Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-167-0
Published January 2017
Copyright
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cc Creative Commons Attribution 3.0