<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Schaffran, J.</author>
             <author>Aderhold, S.</author>
             <author>Monaco, L.</author>
             <author>Reschke, D.</author>
             <author>Steder, L.</author>
             <author>Walker, N.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Analysis of the Test Rate for European XFEL Series Cavities
          </title>
       </titles>
		 <publisher>JACoW</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>978-3-95450-178-6</isbn>
		 <electronic-resource-num>10.18429/JACoW-SRF2015-MOPB079</electronic-resource-num>
		 <language>English</language>
		 <pages>316-318</pages>
       <pages>MOPB079</pages>
       <keywords>
          <keyword>cavity</keyword>
          <keyword>vacuum</keyword>
          <keyword>database</keyword>
          <keyword>site</keyword>
          <keyword>status</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2015</year>
          <pub-dates>
             <date>2015-12</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>http://dx.doi.org/10.18429/JACoW-SRF2015-MOPB079</url>
              <url>http://srf2015.vrws.de/papers/mopb079.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          The main part of the superconducting European XFEL linear accelerator consists of 100 accelerator modules each containing eight RF-cavities. Before the installation to a module, all of these cavities will be tested at cryogenic temperatures in a vertical cryostat in the accelerator module test facility (AMTF) at DESY. This paper discusses the average vertical test rate at the present status. It should be 1 in the ideal case, but actually it’s observed to be approximately 1.5. Classification and analysis concerning the reasons for this deviation are given as well as suggestions for a reduction of the test rate for future production cycles.
       </abstract>
    </record>
  </records>
</xml>
