<xml>
  <records>
    <record>
       <contributors>
          <authors>
             <author>Checchin, M.</author>
             <author>Grassellino, A.</author>
             <author>Martinello, M.</author>
             <author>Romanenko, A.</author>
             <author>Zasadzinski, J.</author>
          </authors>
       </contributors>
       <titles>
          <title>
             Mean Free Path Dependence of the Trapped Flux Surface Resistance
          </title>
       </titles>
		 <publisher>JACoW</publisher>
       <pub-location>Geneva, Switzerland</pub-location>
		 <isbn>978-3-95450-178-6</isbn>
		 <electronic-resource-num>10.18429/JACoW-SRF2015-MOPB020</electronic-resource-num>
		 <language>English</language>
		 <pages>129-134</pages>
       <pages>MOPB020</pages>
       <keywords>
          <keyword>electron</keyword>
          <keyword>SRF</keyword>
          <keyword>niobium</keyword>
          <keyword>simulation</keyword>
          <keyword>superconductivity</keyword>
       </keywords>
       <work-type>Contribution to a conference proceedings</work-type>
       <dates>
          <year>2015</year>
          <pub-dates>
             <date>2015-12</date>
          </pub-dates>
       </dates>
       <urls>
          <related-urls>
              <url>http://dx.doi.org/10.18429/JACoW-SRF2015-MOPB020</url>
              <url>http://srf2015.vrws.de/papers/mopb020.pdf</url>
          </related-urls>
       </urls>
       <abstract>
          In this article a calculation of the trapped flux surface resistance is presented. The two main mechanisms considered in such approach are the oscillation of the magnetic flux trapped in the superconductor due to the Lorentz force, and the static resistance associated to the normal conducting vortex core. The model derived shows a good description of the available experimental data, highlighting that the radio frequency vortex dissipation is mostly due to the static part of the surface resistance. We show that the surface resistance for 100% trapped flux normalized to the trapped field (expressed in nOhm/mG) can be approximated to R/B=18.3*(l f)^{1/2}/(50.1+l) with l the mean free path in nm and f the frequency in GHz.
       </abstract>
    </record>
  </records>
</xml>
