| Paper | Title | Other Keywords | Page |
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| MOP039 | Strategy of Technology Transfer of EXFEL Preparation Technology to Industry | cavity, controls, status, linac | 197 |
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For the EXFEL a specification for the cavitiy preparation procedures (R1)was set up and handed to the industrial companies. Basing on this specification companies hard ware as well as process flows were set up. Beside this specified part of the preparation technique the companies personal needed to be educated and the processes ramped up. To check the quality of the infrastructure, status of education of personal and correct set up of process flows, so called Dummy (DCV) - , Reference (RCV ) and Pre-series (PCV) cavities were assigned. We report on the general strategy applied for the EXFEL technology transfer on cavity preparation and the results obtained on the qualification cavities.
R1) Series Surface and acceptance test preparation of superconducting cavities for the European Xfel (XFEL/A - D) JUNE 30, 2009 |
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| TUP077 | Thin Film Coating Optimization for HIE-ISOLDE SRF Cavities: Coating Parameters Study and Film Characterization | cavity, cathode, niobium, SRF | 623 |
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Funding: Work supported in part by a Marie Curie Early Initial Training Network Fellowship of the European Community's 7th Programme under contract number PITN-GA-2010-264330-CATHI. The HIE-ISOLDE project at CERN requires the production of 32 cavities in order to increase the energy of the beam. The Quarter Wave Resonators (QWRs) cavities of complex cylindrical geometry (0.3m diameter and 0.8m height) are made of copper and are coated with a thin superconducting layer of niobium. In the present phase of the project the aim is to obtain a niobium film, using the DC bias diode sputtering technique, providing adequate high quality factor of the cavities and to ensure reproducibility for the future series production. After an overview of the explored coating parameters (hardware and process), the resulting film characteristics, thickness profile along the cavity, structure and morphology (SEM measurements) and Residual Resistivity Ratio (RRR) of the Nb film will be shown. The effect of the sputtering gas process pressure and configuration of the coating setup will be highlighted. |
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