| Title |
RF Plasma-Based Ion Source Modeling on Unstructured Meshes |
| Authors |
- S.A. Veitzer, K.R.C. Beckwith, M. Kundrapu
Tech-X, Boulder, Colorado, USA
|
| Abstract |
Ion source performance for accelerators and industrial applications can be improved through detailed numerical modeling and simulation. There are a number of technical complexities with developing robust models, including a natural separation of important time scales (rf, electron and ion motion), inclusion of plasma chemistry, and surface effects such as secondary electron emission and sputtering. Due to these computational requirements, it is typically difficult to simulate ion sources with Particle-In-Cell codes. An alternative is to use fluid-based codes coupled with electromagnetics in order to model ion sources. These types of models can simulate plasma evolution and rf-driven flows while maintaining good performance. We show here recent results on modeling the H⁻ ion source for the Spallation Neutron Source (SNS) at Oak Ridge National Laboratory (ORNL) using the fluid plasma modeling code USim. We present new meshing capabilities for generating and parallelizing unstructured computational meshes that have increased our parallel code performance and enabled us to model inductively coupled plasmas for long periods of operation.
|
| Funding |
This work was performed under the auspices of the Department of Energy, Office of Basic Energy Sciences Award #DE-SC0009585. |
| Paper |
download WEPWA059.PDF [0.959 MB / 3 pages] |
| Export |
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| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Wednesday Posters (Washington) |
| Date |
06-May-15 16:00–18:00 |
| Main Classification |
3: Alternative Particle Sources and Acceleration Techniques |
| Sub Classification |
T01 - Proton and Ion Sources |
| Keywords |
ion, simulation, ion-source, plasma, electron |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
|
