| Title |
Numerical Simulation on Emittance Growth Caused by Roughness of a Metallic Photocathode |
| Authors |
- Z. Zhang, C.-X. Tang
TUB, Beijing, People's Republic of China
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| Abstract |
The roughness of a photocathode could lead to an additional uncorrelated divergence of the emitted electrons and therefore to an increased thermal emittance. The randomness of the real-life photocathode surface makes it unrealistic to perform typical beam dynamics simulation to study the roughness emittance growth. We developed a numerical simulation code based on the point spread function (PSF) and an estimated form of electric field distribution on an arbitrary gently undulating surface to deal with the problem. The simulation result surprisingly shows that the emittance growth factor is much smaller than expected (1.5 ~ 2).
|
| Paper |
download WEPWA028.PDF [2.075 MB / 4 pages] |
| Export |
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| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Wednesday Posters (Washington) |
| Date |
06-May-15 16:00–18:00 |
| Main Classification |
3: Alternative Particle Sources and Acceleration Techniques |
| Sub Classification |
T02 - Electron Sources |
| Keywords |
simulation, emittance, electron, cathode, laser |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
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