| Title |
Design of a Microwave Frequency Sweep Interferometer for Plasma Density Measurements in ECR Ion Sources |
| Authors |
- G. Torrisi, R. Agnello, G. Castro, L. Celona, V. Finocchiaro, S. Gammino, D. Mascali, L. Neri, S. Passarello
INFN/LNS, Catania, Italy
- T. Isernia, G. Torrisi
Universitá Mediterranea di Reggio Calabria, Reggio Calabria, Italy
- G. Sorbello
University of Catania, Catania, Italy
|
| Abstract |
Electron Cyclotron Resonance Ion Sources (ECRIS) are among the candidates to support the growing request of intense beams of multicharged ions. Their further development is related to the availability of new diagnostic tools, nowadays consisting of few types only of devices designed on purpose for such compact machines. Microwave Interferometry is a non-invasive method for plasma diagnostics and represents the best candidate for the whole plasma density measurements. Interferometry in ECR Ion Sources is a challenging task due to their compact size. The typical density range of ECR plasmas (10¹¹-10¹² cm⁻³) causes the probing beam wavelength to be in the order of few centimetres, which is comparable to the chamber radius. The paper describes the design of a new microwave interferometer based on the so-called "frequency sweep" method: the density is here derived by the frequency shift of a beating signal obtained during the fast sweep of both probing and reference microwave signals; inner cavity multipaths contributions can thereby be suppressed by cleaning the spurious frequencies from the beating signal spectrum.
|
| Paper |
download WEPWA012.PDF [0.658 MB / 3 pages] |
| Export |
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| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Wednesday Posters (Washington) |
| Date |
06-May-15 16:00–18:00 |
| Main Classification |
3: Alternative Particle Sources and Acceleration Techniques |
| Sub Classification |
T01 - Proton and Ion Sources |
| Keywords |
plasma, ion, simulation, diagnostics, ion-source |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
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