| Title |
Low Powered RF Measurements of Dielectric Materials for use in High Pressure Gas Filled RF Cavities |
| Authors |
- B.T. Freemire
IIT, Chicago, Illinois, USA
- G. Arriaga
Northern Illinois Univerity, Dekalb, Illinois, USA
- D.L. Bowring, A.V. Kochemirovskiy, A. Moretti, A.V. Tollestrup, Y. Torun, K. Yoneharapresenter
Fermilab, Batavia, Illinois, USA
- H.D. Phan
McDaniel College, Westminster, USA
- Y. Torun
Illinois Institute of Technology, Chicago, Illlinois, USA
|
| Abstract |
The Helical Cooling Channel scheme envisioned for a Muon Collider or Neutrino Factory requires high pressure gas filled radio frequency cavities to operate in superconducting magnets. One method to shrink the radii of the cavities is to load them with a dielectric material. The dielectric constant, loss tangent, and dielectric strength are important in determining the most suitable material. Low powered RF measurements of the dielectric constant and loss tangent were taken for multiple purities of alumina and magnesium calcium titanate, as well as cordierite, forsterite, and aluminum nitride. Measurements of alumina were consistent with previously reported results. The results were used to design an insert for a high powered RF test that included sending beam through the cavity.
|
| Paper |
download WEPTY050.PDF [0.597 MB / 3 pages] |
| Export |
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| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Wednesday Posters (Tyler) |
| Date |
06-May-15 16:00–18:00 |
| Main Classification |
7: Accelerator Technology |
| Sub Classification |
T06 - Room Temperature RF |
| Keywords |
cavity, simulation, radio-frequency, factory, collider |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
|
