| Title |
Multiple Scattering Effects of a Thin Beryllium Window on a Short, 2 nC, 60 MeV Bunched Electron Beam |
| Authors |
- E.E. Wisniewski, M.E. Conde, W. Gai, G. Ha, J.G. Power
ANL, Argonne, Illinois, USA
- G. Ha
POSTECH, Pohang, Kyungbuk, Republic of Korea
|
| Abstract |
The Argonne Wakefield Accelerator 75 MeV drive beamline at Argonne National Laboratory has as its electron source a Cesium telluride photocathode gun with a vacuum requirement on the order of 10⁻¹⁰ torr. In conflict with this, the experimental program at AWA sometimes requires beamline installation of experimental structures which due to materials and/or construction cannot meet the stringent vacuum requirement. One solution is to sequester these types of structures inside a separate vacuum chamber and inject the beam through a thin Beryllium window. The downside is that multiple scattering effects degrade the beam quality to some degree which is not well-known. This study was done in an effort to better understand and predict the multiple scattering effects of the Be thin window, particularly on the beam transverse size. The results of measurements are compared with GEANT4 Monte Carlo simulations via G4beamline and analytical calculations via GPT.
|
| Funding |
U.S. Dept of Energy Office of Science under contract number DE-AC02-06CH11357. |
| Paper |
download WEPTY012.PDF [0.347 MB / 3 pages] |
| Export |
download ※ BibTeX
※ LaTeX
※ Text/Word
※ RIS
※ EndNote |
| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Wednesday Posters (Tyler) |
| Date |
06-May-15 16:00–18:00 |
| Main Classification |
7: Accelerator Technology |
| Sub Classification |
T31 - Subsystems, Technology, and Components, Other |
| Keywords |
scattering, simulation, vacuum, experiment, emittance |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
|
