| Title |
Design and Research of Secondary Electron Emission Test Equipment with Low Electron Energy |
| Authors |
- Y.H. Xu, L. Fan, Y.Z. Hong, X.T. Pei, J. Wangpresenter, Y. Wang, W. Wei, B. Zhang
USTC/NSRL, Hefei, Anhui, People's Republic of China
|
| Abstract |
In particle accelerators, the secondary electrons resulting from the interaction between particles and vacuum chamber have a great impact on beam quality. Especially for positron, proton and heavy ion accelerators, massive electrons lead to electron cloud, which affects the stability, energy, emittance and beam life adversely. We have studied the secondary electron emission (SEE) of metal used for accelerators. A secondary electron emission measurement system with low electron energy has been designed and used to measure the SEE yield of metal and non-evaporable getter materials. With the equipment, we have obtained the characteristic of the SEE yield of stainless steel and oxygen free copper (OFC).
|
| Paper |
download WEPMN021.PDF [0.456 MB / 3 pages] |
| Export |
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| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Wednesday Posters (Monroe) |
| Date |
06-May-15 16:00–18:00 |
| Main Classification |
7: Accelerator Technology |
| Sub Classification |
T14 - Vacuum Technology |
| Keywords |
electron, gun, vacuum, ion, accumulation |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
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