| Title |
Single-shot Multi-MeV Ultrafast Electron Diffraction on VELA at Daresbury Laboratory |
| Authors |
- L.K. Rudge, D. Angal-Kalinin, J.A. Clarke, F. Jackson, J.K. Jones, A. Kalinin, S.L. Mathisen, J.W. McKenzie, B.L. Militsyn, B.D. Muratori, T.C.Q. Noakes, Y.M. Saveliev, D.J. Scott, P.H. Williams
STFC/DL/ASTeC, Daresbury, Warrington, Cheshire, United Kingdom
- P. Aden, R.J. Cash, D.M.P. Holland, M.D. Roper
STFC/DL, Daresbury, Warrington, Cheshire, United Kingdom
- P.D. Lane, D.A. Wann
University of York, York, United Kingdom
- M. Surman
STFC/DL/SRD, Warrington, Cheshire, United Kingdom
- J.G. Underwood
UCL, London, United Kingdom
|
| Abstract |
Accelerator based Ultrafast Electron Diffraction (UED) is a technique for obtaining static structures and for studying sub-100 fs dynamic structural changes on the atomic scale. In this paper we present the first electron diffraction results obtained from the VELA accelerator in 2014. The accelerator was operated to provide typically 4MeV/c electron bunches. Diffraction patterns were observed with <<1 pC transported to the detection screen. Single shot and multi-shot accumulated diffraction data are presented from single crystal and polycrystalline samples, including Au, Al, Pt and C. Contamination of the diffraction pattern with dark current contributions is an issue. A variable size aperture directly in front of the sample offers some mitigation, but at the expense of reduced charge contributing to the diffraction pattern. We discuss future developments for electron diffraction on VELA including further beam optimization, measurement of bunch length with a newly installed Transverse Deflecting Cavity, and the planned developments for pump-probe studies.
|
| Funding |
This work was funded by STFC |
| Paper |
download TUPWI017.PDF [1.226 MB / 4 pages] |
| Export |
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※ EndNote |
| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Tuesday Posters (Wilson) |
| Date |
05-May-15 16:00–18:00 |
| Main Classification |
8: Applications of Accelerators, Tech Transfer, and Industrial Relations |
| Sub Classification |
U02 - Materials Analysis and Modification |
| Keywords |
electron, gun, FEL, scattering, experiment |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
|
