| Title |
RF Gun Based Ultrafast Electron Microscopy |
| Authors |
- J. Yang, K. Tanimura, Y. Yoshida
ISIR, Osaka, Japan
- J. Urakawa
KEK, Ibaraki, Japan
|
| Abstract |
Ultrafast electron microscopy (UEM) would be a powerful tool for the direct visualization of structural dynamic processes in matter. The resolutions of the observation on femtosecond time scales over sub-nanometer (even atomic) spatial dimensions have long been a goal in science. To achieve such resolutions, we have designed and constructed a femtosecond time-resolved relativistic-energy electron microscopy using a photocathode radio-frequency (RF) electron gun (RF based UEM). The RF gun has successfully generated a high-brightness electron beam with bunch length of 100 fs and emittance of 0.2 mm-mrad, which are essential beam parameters for the achievement of nm-fs space-time resolution in the microscopy. Both the static measurements of both relativistic-energy electron diffraction and image have been succeeded. In this presentation, the activities on RF based UEM are introduced. The requirements and limitations of the beam parameters are reviewed. The concept and design of RF based UEM are reported. Finally, some demonstrations of the relativistic-energy UEM images are reported.
|
| Paper |
download TUPWI008.PDF [0.810 MB / 3 pages] |
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| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Tuesday Posters (Wilson) |
| Date |
05-May-15 16:00–18:00 |
| Main Classification |
8: Applications of Accelerators, Tech Transfer, and Industrial Relations |
| Sub Classification |
U05 - Other Applications |
| Keywords |
electron, gun, emittance, cavity, cathode |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
|
