| Title |
Comparison of Beam Diagnostics for 3rd and 4th Generation Ring-based Light Sources |
| Authors |
- H. Maesaka
RIKEN SPring-8 Center, Sayo-cho, Sayo-gun, Hyogo, Japan
|
| Abstract |
This talk will present the challenges and progress required in beam instrumentation for next generation storage-ring light sources. These light sources aim at small natural emittance of approximately 100 pm rad in order to achieve much higher brightness than the present 3rd generation light sources. This small emittance is realized by a multi-bend lattice, which has a small dynamic aperture of only several mm, a small beam size of approximately 10 microns, etc. Therefore, the beam orbit must be precisely measured by beam position monitors (BPM) for the orbit correction and the beam size should be monitored with less than 10-micron resolution in order to estimate the beam emittance. A bunch-by-bunch feedback system is also required for the suppression of various instabilities coming from narrow beam chamber. In addition, since the stable tune region is small, a real-time tune monitor is demanded for the tune correction. We introduce leading-edge instrumentation techniques to overcome these difficulties, comparing with of 3rd generation light sources.
|
| Paper |
download THYC1.PDF [0.337 MB / 5 pages] |
| Slides |
download THYC1_TALK.PDF [3.690 MB] |
| Export |
download ※ BibTeX
※ LaTeX
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※ EndNote |
| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Invited Orals (MC6) |
| Date |
07-May-15 11:00–12:30 |
| Main Classification |
6: Beam Instrumentation, Controls, Feedback, and Operational Aspects |
| Sub Classification |
T03 - Beam Diagnostics and Instrumentation |
| Keywords |
photon, diagnostics, feedback, emittance, electronics |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
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