| Title |
Simulation Studies of Plasma-based Charge Strippers |
| Authors |
- O.S. Haas
TEMF, TU Darmstadt, Darmstadt, Germany
|
| Abstract |
Calculations on the charge state distributions in different charge stripping media are presented. The main focus of this work is the width and peak efficiency of the final charge state distribution. For equal number densities fully-stripped plasma stripping media achieve much higher charge states than gas stripping media of the same nuclear charge. This is due to the reduced electron capture rates of free target electrons compared to bound target electrons. Furthermore, targets with low nuclear charge like hydrogen achieve higher charge states than targets with high nuclear charge like nitrogen in the case of both a plasma and a gas target. Equal final mean charge states can thus be achieved with lower density for plasmas and targets with low nuclear charge. The widths of the charge state distributions are very similar, slightly smaller for plasmas due to the different scaling of the dielectronic recombination rate. In comparison with calculations and measurements published in literature this work underestimates the width of targets with higher nuclear charge like, e.g., nitrogen gas. This is mainly due to the omission of multiple loss processes in the presented calculations. In the future we intend to expand the methods and models used in this work to improve the agreement with different measurements on charge state distributions in plasmas and gases.
|
| Paper |
download THPF018.PDF [2.049 MB / 3 pages] |
| Export |
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| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Thursday Posters |
| Date |
07-May-15 16:00–18:00 |
| Main Classification |
4: Hadron Accelerators |
| Sub Classification |
T32 - Ion Beam Stripping |
| Keywords |
target, plasma, electron, ion, heavy-ion |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
|
