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| Title | Transverse Emittance Measurement for Low Energy Ion Beams Using Quadrupole Scan Method | |||||
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| Abstract | Low energy ion beam facility (LEIBF) * at IUAC consists of all permanent magnet 10 Ghz electron cyclotron resonance (ECR) ion source (NANOGUN) ** along with 400 kV high voltage accelerating platform, a switching cum analysing magnet and electrostatic quadrupoles. Higher beam currents of heavy charge states and low energy of ion beams puts tremendous challenge to transport the ion beam from source to target. The normalized emittance of analysed ion beam is measured for specific charge to mass ratio using electrostatic quadrupole scan method *** for various source parameters like RF power and injection pressure of gas etc. For various m/q ratios, the normalized transverse emittance ranges from 0.1 to 0.6 mm-mrad. It is attributed to beam rotation induced by ECR axial magnetic field, effect of ion temperature in plasma, non linear electric fields and space charge etc which play a significant role in emittance growth. | |||||
| Footnotes & References | * A. Mandal et. al. Proceedings of IPAC2011, WEPC011, San Sebastián, Spain ** D Kanjilal et. al. Indian J. Pure Appl. Phys. 39 (2001) 25 *** I. G. Brown:The physics and technology of ion sources |
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| Paper | download MOPWA048.PDF [0.404 MB / 3 pages] | |||||
| Export | download ※ BibTeX ※ LaTeX ※ Text/Word ※ RIS ※ EndNote | |||||
| Conference | IPAC2015, Richmond, VA, USA | |||||
| Series | International Particle Accelerator Conference (6th) | |||||
| Proceedings | Link to full IPAC2015 Proccedings | |||||
| Session | Monday Posters (Washington) | |||||
| Date | 04-May-15 16:00–18:00 | |||||
| Main Classification | 5: Beam Dynamics and EM Fields | |||||
| Sub Classification | D01 - Beam Optics - Lattices, Correction Schemes, Transport | |||||
| Keywords | ion, emittance, plasma, ion-source, ECR | |||||
| Publisher | JACoW, Geneva, Switzerland | |||||
| Editors | Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) | |||||
| ISBN | 978-3-95450-168-7 | |||||
| Published | June 2015 | |||||
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