| Title |
Investigations of the Space-Charge-Limited Emission in the L-Band E-Xfel Photoinjector at Desy-Pitz |
| Authors |
- Y. Chen, H. De Gersem, E. Gjonaj, A.V. Tsakanianpresenter, T. Weiland
TEMF, TU Darmstadt, Darmstadt, Germany
- C. Hernandez-Garcia
JLab, Newport News, Virginia, USA
- M. Krasilnikov, F. Stephan
DESY Zeuthen, Zeuthen, Germany
|
| Abstract |
This paper discusses the numerical modelling of electron bunch emission for an L-band normal conducting RF photogun. The main objective is clarifying the discrepancies between measurements and simulations performed for the European X-ray Free Electron Laser (E-XFEL) injector at DESY-PITZ. An iterative beam dynamics simulation procedure is proposed for the calculation of the total extracted bunch charge under the assumption that the emission source operates at the space-charge limit of the gun. This algorithm has been implemented in the three-dimensional full electromagnetic PIC Solver of the CST Particle Studio (CST-PS)*. Simulation results are in good agreements with measurements for a series of operation parameters. Further comparisons with a conventional Poisson-solver-based (PSB) tracking algorithm demonstrates the great significance of transient electromagnetic field effects for the beam dynamics in high brightness electron sources.
|
| Footnotes & References |
* Computer Simulation Technology AG, http://www.cst.com/
|
| Funding |
work supported by DESY Hamburg and Zeuthen Sites |
| Paper |
download MOPWA029.PDF [1.124 MB / 3 pages] |
| Export |
download ※ BibTeX
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※ EndNote |
| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Monday Posters (Washington) |
| Date |
04-May-15 16:00–18:00 |
| Main Classification |
5: Beam Dynamics and EM Fields |
| Sub Classification |
D11 - Code Developments and Simulation Techniques |
| Keywords |
simulation, space-charge, gun, cathode, electron |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
|
