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https://doi.org/10.18429/JACoW-IPAC2015-MOPTY072
Title Beam Loss Study of TLS Using RadFETs
Authors
  • C.H. Huang, J. Chen, Y.-S. Chengpresenter, K.T. Hsu, K.H. Hu, D. Lee, C.Y. Wu
    NSRRC, Hsinchu, Taiwan
Abstract To realize the beam loss during the operation of Taiwan light source, P-type radiation-sensing field-effect transistors are setup around the storage ring. A sixteen-channel readout box is used to read the threshold voltage of the radiation-sensing field-effect transistors during irradiation. The beam loss distribution and mechanism at the injection period, decay mode and top up injection for routing operation will be studied in this report.
Paper download MOPTY072.PDF [1.192 MB / 3 pages]
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Conference IPAC2015, Richmond, VA, USA
Series International Particle Accelerator Conference (6th)
Proceedings Link to full IPAC2015 Proccedings
Session Monday Posters (Tyler)
Date 04-May-15   16:00–18:00
Main Classification 6: Beam Instrumentation, Controls, Feedback, and Operational Aspects
Sub Classification T03 - Beam Diagnostics and Instrumentation
Keywords injection, radiation, storage-ring, controls, booster
Publisher JACoW, Geneva, Switzerland
Editors Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany)
ISBN 978-3-95450-168-7
Published June 2015
Copyright
Copyright © 2015 by JACoW, Geneva, Switzerland     CC-BY Creative Commons License
cc Creative Commons Attribution 3.0