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| Title | Online Spill Intensity Monitoring for Improving Extraction Quality at CNAO | |||||
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| Abstract | The CNAO Foundation is the first Italian center for deep hadrontherapy with Protons and Carbon Ions, performing treatments since September 2011. The extracted beam energy and intensity can vary over a wide range (60-250 MeV for Protons and 120-400 MeV/u for Carbon Ions, 4e6/10¹⁰ pps); the beam intensity uniformity during the slow extraction process is a fundamental requirement for achieving accurate and fast treatments. CNAO developed an online Fast Intensity Monitor (FIM), not perturbing the extracted beam, capable of measuring beam intensity with a bandwidth of 50kHz and a resolution of 1%. It consists of a thin (0.8 μm) metallic foil that emits secondary electrons when traversed by the beam. The electrons are multiplied by a Channeltron device, polarized at high voltage versus ground. The Channeltron output current is amplified and converted in a Pulse Width Modulated (PWM) signal, which is then decoupled and transmitted to the equipment room, where an FPGA implements a servo-spill. The work presents the detector, the floating electronics, the preliminary measurements with beam and the integration in a closed loop on the synchrotron air-core quadrupole obtaining promising results. | |||||
| Paper | download MOPHA050.PDF [0.897 MB / 3 pages] | |||||
| Export | download ※ BibTeX ※ LaTeX ※ Text/Word ※ RIS ※ EndNote | |||||
| Conference | IPAC2015, Richmond, VA, USA | |||||
| Series | International Particle Accelerator Conference (6th) | |||||
| Proceedings | Link to full IPAC2015 Proccedings | |||||
| Session | Monday Posters (Harrison) | |||||
| Date | 04-May-15 16:00–18:00 | |||||
| Main Classification | 6: Beam Instrumentation, Controls, Feedback, and Operational Aspects | |||||
| Sub Classification | T03 - Beam Diagnostics and Instrumentation | |||||
| Keywords | electron, proton, ion, electronics, extraction | |||||
| Publisher | JACoW, Geneva, Switzerland | |||||
| Editors | Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) | |||||
| ISBN | 978-3-95450-168-7 | |||||
| Published | June 2015 | |||||
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