| Title |
Studies for a Wakefield-Optimized Near-Field EO Setup at the ANKA Storage Ring |
| Authors |
- P. Schönfeldt, A. Borysenkopresenter, N. Hiller, B. Kehrer, A.-S. Müller
KIT, Karlsruhe, Germany
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| Abstract |
ANKA, the synchrotron light source of the Karlsruhe Institute of Technology (KIT), is the first storage ring with a near-field single-shot electro-optical (EO) bunch profile monitor inside its vacuum chamber. Using the method of electro-optical spectral decoding (EOSD), the current setup made it possible to study longitudinal beam dynamics (e.g. microbunching) occurring during ANKA's low-alpha-operation with sub-ps resolution (granularity). However, the setup induces strong wake-fields spanning the distance between consecutive bunches which cause heat load to the in-vacuum setup for high beam currents. This heat load in turn leads to a laser misalignment thus preventing measurements during multi-bunch operation. Fortunately, the EOSD setup also allows us to directly study these wake-fields so simulation results can be compared to measurement data. This paper reviews possible changes of the setup's geometry with respect to a reduction of the wakefield effects.
|
| Funding |
This work is funded by the BMBF contract numbers 05K10VKC, and 05K13VKA. |
| Paper |
download MOPHA038.PDF [0.444 MB / 3 pages] |
| Export |
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| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Monday Posters (Harrison) |
| Date |
04-May-15 16:00–18:00 |
| Main Classification |
6: Beam Instrumentation, Controls, Feedback, and Operational Aspects |
| Sub Classification |
T03 - Beam Diagnostics and Instrumentation |
| Keywords |
laser, wakefield, simulation, operation, electron |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
|