| Title |
Modeling/Measurement Comparison of Signal Collection in Diamond Sensors in Extreme Conditions |
| Authors |
- V. Kubytskyi, P. Bambade, S. Liu
LAL, Orsay, France
|
| Abstract |
Here we present a study of charge collection dynamics in a Diamond Sensor (DS) subjected to intensities from 1 to 10⁸ Minimum Ionizing Particles (MIP). We developed a model based on the numerical solution of the 1D drift-diffusion equations, using the Scharfetter-Gummel discretization scheme. Inhomogeneity of the space-charge distribution together with the externally applied electric field are taken into account by analytically solving the Poisson equation at each time step. We identified two regimes of charge collection. The first corresponds to 1-10⁵ MIPs, in this case the externally applied electric field is negligibly perturbed by space-charge effects during the separation of the electron/hole clouds. The second corresponds to intensities larger than 10⁷ MIPs, where the space-charge effects significantly slow down the charge collection due to large concentrations of electron/hole pairs in the DS volume. The results of our modeling are in qualitative agreement with the experimental data acquired at the PHoto-Injector electron beam facility at LAL. Our model allows optimizing DS parameters to achieve desired charge collection times for different beam intensities.
|
| Paper |
download MOPHA007.PDF [0.565 MB / 4 pages] |
| Export |
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| Conference |
IPAC2015, Richmond, VA, USA |
| Series |
International Particle Accelerator Conference (6th) |
| Proceedings |
Link to full IPAC2015 Proccedings |
| Session |
Monday Posters (Harrison) |
| Date |
04-May-15 16:00–18:00 |
| Main Classification |
6: Beam Instrumentation, Controls, Feedback, and Operational Aspects |
| Sub Classification |
T33 - Online modeling and software tools |
| Keywords |
electron, space-charge, detector, simulation, scattering |
| Publisher |
JACoW, Geneva, Switzerland |
| Editors |
Stuart Henderson (ANL, Argonne, IL, USA); Evelyn Akers (Jlab, Newport News, VA, USA); Todd Satogata (JLab, Newport News, VA, USA); Volker R.W. Schaa (GSI, Darmstadt, Germany) |
| ISBN |
978-3-95450-168-7 |
| Published |
June 2015 |
| Copyright |
|
