Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials:  Experimental Input for Instability Simulations in High Intensity Accelerators

Cimino, Roberto; Schäfers, Franz

doi:10.18429/JACoW-IPAC2014-WEPME034

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BiBTeX citation export for WEPME034: Soft X-ray Reflectivity and Photoelectron Yield of Technical Materials: Experimental Input for Instability Simulations in High Intensity Accelerators

@InProceedings{Cimino:IPAC2014-WEPME034,
  author       = {R. Cimino and F. Schäfers},
  title        = {{S}oft {X-}ray {R}eflectivity and {P}hotoelectron {Y}ield of {T}echnical {M}aterials:  {E}xperimental {I}nput for {I}nstability {S}imulations in {H}igh {I}ntensity {A}ccelerators},
  booktitle    = {Proc. 5th International Particle Accelerator Conference (IPAC'14),
                  Dresden, Germany, June 15-20, 2014},
  pages        = {2335--2337},
  paper        = {WEPME034},
  language     = {english},
  keywords     = {photon, electron, optics, radiation, synchrotron},
  venue        = {Dresden, Germany},
  series       = {International Particle Accelerator Conference},
  number       = {5},
  publisher    = {JACoW},
  address      = {Geneva, Switzerland},
  month        = {July},
  year         = {2014},
  isbn         = {978-3-95450-132-8},
  doi          = {https://doi.org/10.18429/JACoW-IPAC2014-WEPME034},
  url          = {http://jacow.org/ipac2014/papers/wepme034.pdf},
  note         = {https://doi.org/10.18429/JACoW-IPAC2014-WEPME034},
}